* the content of both sessions is identical

What to expect?

Objects are far more than flat—they can be curved, bent, or even spiky. Unlike predominantly two-dimensional paintings, which are easily accessible for non-invasive analytical techniques, many Cultural Heritage artifacts are much more complex. Archaeological or handcrafted objects, made from metal, glass, wood, ceramics, stone, and organic materials, often have intricate forms. In such cases, high surface topography presents a significant challenge for imaging analysis with high spatial resolution.

Recent experimental approaches for micro-XRF scanning seek to overcome this obstacle by evaluating techniques that either follow the surface topography or correct post-processed data from open beam systems based on the Ar-signal. However, tracking surface contours is impractical for highly irregular or intricate objects, where the spectrometer cannot always be ideally positioned perpendicular to the surface. Even corrections using the Ar-signal have their limitations. Despite advances in these methods, the complexity of the task remains significant, especially when it involves high-speed movements just millimetres away from a unique and irreplaceable object, increasing the risk of damage.

In this webinar, we will present various approaches for measuring a wide range of Cultural Heritage objects, from crucible fragments to large copper cauldrons, Indonesian meteoritic iron daggers to 18th-century French porcelain, and Italian glass beads to Chinese ceramics. These artifacts share a common challenge—they are often non-ideal for micro-XRF analysis. Factors such as their three-dimensional shapes, complex structures, or non-infinite geometries can complicate the process.

We will introduce different methodologies and workflows to overcome these obstacles, using a variety of case studies. With Bruker's patented Aperture Management System, we can achieve high spatial resolution even on samples with significant topography. This feature of the 2 x 60 mm² SDD high-end M6 JETSTREAM allows us to analyze complex objects without compromising their safety.

If you're curious to discover what spatially resolved micro-XRF can achieve, we invite you to join us for our webinar.

Who should attend?

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Chemical distribution map of a heavily charging pharmaceutical sample (multivitamin tablet) at 10 kV and low probe current (< 150 pA) with a short measurement time (67 seconds) and high count rate of 46,700 cps.

Ultra-high resolution SEM EDS map of a bulk FinFET structure acquired at 5 kV with XFlash® FlatQUAD with a high countrate of 309,000 cps in 90 seconds. The peak overlaps of Si-K (1.74 keV), W-M (1.81 keV) and Hf-M (1.67 keV) X-ray lines are automatically deconvoluted during acquisition.

Our Speakers

Dr. Roald Tagle Global Manager Application Science XMP, Bruker Nano Analytics

Mareike Gerken M.A. Application Scientist XMP, Bruker Nano Analytics

Michele Gironda Head of Global Segment Management, Bruker Nano Analytics