BRUKER NANO ANALYTICS PRESENTS:

Tracing craftsmanship: Analyzing archaeological objects and handcraft using micro-XRF analysis

December 5th 2024



Live Session 1*
Thursday
December 5th 2024
Live Session 2*
Thursday
December 5th 2024
10 am CET / Berlin
5 pm SGT / Singapore
6 pm JST / Tokyo
5 pm CET / Berlin
8 am SGT / Los Angeles
11 am JST / New York

* the content of both sessions is identical

What to expect?

Objects are far more than flat—they can be curved, bent, or even spiky. Unlike predominantly two-dimensional paintings, which are easily accessible for non-invasive analytical techniques, many Cultural Heritage artifacts are much more complex. Archaeological or handcrafted objects, made from metal, glass, wood, ceramics, stone, and organic materials, often have intricate forms. In such cases, high surface topography presents a significant challenge for imaging analysis with high spatial resolution.


Recent experimental approaches for micro-XRF scanning seek to overcome this obstacle by evaluating techniques that either follow the surface topography or correct post-processed data from open beam systems based on the Ar-signal. However, tracking surface contours is impractical for highly irregular or intricate objects, where the spectrometer cannot always be ideally positioned perpendicular to the surface. Even corrections using the Ar-signal have their limitations. Despite advances in these methods, the complexity of the task remains significant, especially when it involves high-speed movements just millimetres away from a unique and irreplaceable object, increasing the risk of damage.


In this webinar, we will present various approaches for measuring a wide range of Cultural Heritage objects, from crucible fragments to large copper cauldrons, Indonesian meteoritic iron daggers to 18th-century French porcelain, and Italian glass beads to Chinese ceramics. These artifacts share a common challenge—they are often non-ideal for micro-XRF analysis. Factors such as their three-dimensional shapes, complex structures, or non-infinite geometries can complicate the process.


We will introduce different methodologies and workflows to overcome these obstacles, using a variety of case studies. With Bruker's patented Aperture Management System, we can achieve high spatial resolution even on samples with significant topography. This feature of the 2 x 60 mm² SDD high-end M6 JETSTREAM allows us to analyze complex objects without compromising their safety.


If you're curious to discover what spatially resolved micro-XRF can achieve, we invite you to join us for our webinar.


Who should attend?

plus Everyone interested in or using XRF and micro-XRF as a qualitative and quantitative analysis technique for three-dimensional materials.

plus Archaeologist, Object conservators, Cultural Heritage Scientist

plus M4 TORNADO, M6 JETSTREAM users





Register to save your spot now

Fig. 1 Porcelain decoration measured at 4 cm distance with the M6 JETSTREAM. Thanks to the AMS feature, the flower decoration can be visualised in high resolution.

Fig. 2 Indonesian iron Kris dagger measured with the M6 JETSTREAM at 50 kV 600 µA and the AMS 500.


5 kV SEM EDS map of a highly topographic, curved and charging surface of a Radiolaria. XFlash® FlatQUAD’s annular 4-segment SDD design enables signal collection from four sides of the sample.


Chemical distribution map of a heavily charging pharmaceutical sample (multivitamin tablet) at 10 kV and low probe current (< 150 pA) with a short measurement time (67 seconds) and high count rate of 46,700 cps.


Ultra-high resolution SEM EDS map of a bulk FinFET structure acquired at 5 kV with XFlash® FlatQUAD with a high countrate of 309,000 cps in 90 seconds. The peak overlaps of Si-K (1.74 keV), W-M (1.81 keV) and Hf-M (1.67 keV) X-ray lines are automatically deconvoluted during acquisition.



Our Speakers

Arrow

Dr. Roald Tagle

Global Manager Application Science XMP,
Bruker Nano Analytics

Dr. Roald Tagle
Arrow

Mareike Gerken M.A.

Application Scientist XMP,
Bruker Nano Analytics

Mareike Gerken M.A.
Arrow

Michele Gironda

Head of Global Segment Management,
Bruker Nano Analytics

Michele Gironda

Can't Attend the Live Webinar?

Don't worry if you can't attend the live webinar - Register anyway and we will send you the webinar recording and slides shortly after the webinar broadcast.

Can't Attend the Live Webinar?