BRUKER NANO ANALYTICS PRESENTS:

Analytical Cryo-SEM EDS Mapping for Biological and Life Science Applications

December 3rd 2024


Live Session 1*
Tuesday
December 3rd 2024
Live Session 2*
Tuesday
December 3rd 2024
10 am CET / Berlin
5 pm SGT / Singapore
6 pm JST / Tokyo
5 pm CET / Berlin
8 am SGT / Los Angeles
11 am JST / New York

* the content of both sessions is identical

What to expect?

Analytical electron microscopy (EM) techniques such as energy-dispersive X-ray spectroscopy (EDS) are invaluable for studying biological samples containing minerals like calcium carbonate (CaCO₃), metal ions, or other compositions beyond carbon and oxygen. However, analyzing beam-sensitive materials can be challenging due to their low signal output and long acquisition times, often leading to sample damage and loss of the measured area. The XFlash® FlatQUAD detector was utilized to overcome these challenges, enabling the study of beam-sensitive organic materials, particularly frozen biological samples in scanning electron microscopy (SEM).


In this webinar, our guest speaker, Dr. Ifat Kaplan will present the cryo-SEM-EDS workflow, along with imaging and spectral data that reveal the distribution of metal ions during silk processing in silkworms. SEM EDS mapping under cryo-conditions reveals the composition and spatial localization of metal ions during silk evolution within the silk gland. These findings were recently published in *Nature Communications* (*O. Brookstein et al., 2024, DOI: 10.1038/s41467-024-50879-9*).


Join us for this informative 30-minute session to learn about the exceptional performance of the XFlash® FlatQUAD, a highly sensitive EDS detector for SEM, which is optimial for chemical mapping of biological and life science specimens. Discover how this cutting-edge technology handles even the most challenging samples with unparalleled speed (10x–50x faster compared with conventional EDS detectors) and sensitivity, making it a top choice for SEM EDS analysts.



What you will learn?

plus What makes the XFlash® FlatQUAD an ideal detector for chemical mapping of life science specimens.

plus Limitations of conventional large-area EDS detectors for analyzing biological materials.

plus Benefits of low-kV chemical mapping with EDS in SEM.

plus Fast chemical mapping of light elements (Up to Boron) in biological samples using SEM EDS.

Who should attend?

plus Researchers, students, and industry professionals focusing on chemical analysis of biological materials.

plus SEM and TEM users seeking advanced techniques for characterizing life science specimens.




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15 kV EDS maps of Spider silk fibers showing chemical distribution present in the material, scalebar is 50 µm.


15 kV EDS maps of Spider silk fibers showing chemical distribution present in the material, scalebar is 50 µm.




5 kV SEM EDS map of a highly topographic, curved and charging surface of a Radiolaria. XFlash® FlatQUAD’s annular 4-segment SDD design enables signal collection from four sides of the sample.


Chemical distribution map of a heavily charging pharmaceutical sample (multivitamin tablet) at 10 kV and low probe current (< 150 pA) with a short measurement time (67 seconds) and high count rate of 46,700 cps.


Ultra-high resolution SEM EDS map of a bulk FinFET structure acquired at 5 kV with XFlash® FlatQUAD with a high countrate of 309,000 cps in 90 seconds. The peak overlaps of Si-K (1.74 keV), W-M (1.81 keV) and Hf-M (1.67 keV) X-ray lines are automatically deconvoluted during acquisition.



Our Speakers

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Dr. Ifat Kaplan-Ashiri

Associate Staff Scientist
Electron Microscopy Unit, Department of Chemical Research Support, Weizmann Institute of Science

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Dr. Purvesh Soni

Application Scientist EDS
Bruker Nano Analytics

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Can't Attend the Live Webinar?

Don't worry if you can't attend the live webinar - Register anyway and we will send you the webinar recording and slides shortly after the webinar broadcast.

Can't Attend the Live Webinar?